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/ 3 Years ago, sat, may 1, 2021, 6:11:00
Ubuntu 13.04. The number of bad sectors on my SSD has steadily increased until 226 bad sectors today.
The thing is, I don't know whether 226 bad sectors is 0.0001% of the SSD, 1% of the SSD, or 99% of the SSD.
I haven't found anything on the internet this morning to answer this question.
The Disks utility doesn't tell me either, and I can't find the information in SMART Data.
sudo smartctl -a /dev/sda
shows this:
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-31-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 PRO Series
Serial Number: S1ATNEAD645474H
LU WWN Device Id: 5 002538 5503c15c0
Firmware Version: DXM05B0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4c
Local Time is: Fri Jan 24 20:37:08 2014 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (53956) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 20) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 097 097 010 Pre-fail Always - 238
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1331
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 341
177 Wear_Leveling_Count 0x0013 097 097 000 Pre-fail Always - 75
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 097 097 010 Pre-fail Always - 238
181 Program_Fail_Cnt_Total 0x0032 097 097 010 Old_age Always - 238
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 097 097 010 Pre-fail Always - 238
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 067 062 000 Old_age Always - 33
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 099 099 000 Old_age Always - 1
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 128
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 33308592070
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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